The WIS-2400 Wafer Inspection System is a wafer sorter with outstanding capabilities for integrating various types of inspection modules including AOI inspection, micro-crack inspection, and features real-time diagnosis. Its flexible design easily integrates most major stream modules available on the market. Complete data output and recording greatly simplifies the wafer tracking and management process, with fully-customizable categorization.
A user-friendly GUI with real-time display ensures detailed system monitoring and easy operation.
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